TY  - BOOK
AU  - Cohn, Charles
AU  - 
AU  - Harper, Charles A.
TI  - Failure-free integrated circuit packages: systematic elimination of failures through reliability engineering
SN  - 0-07-143484-4
U1  - 621.381522 C678 2005 
CY  - New York
PB  - McGraw-Hill.
KW  - Integrated circuits--Fault tolerance
KW  - Microelectronic packaging
ER  -